This white paper, co-written by Parker's Brian Handerhan and Patrick Lehr, goes into detail on the demands of dynamic metrology applications as they apply to the selection of precision linear motion control components and systems. In addition, the relevance of Moore's Law is examined in the context of the industry. There is no charge to download this document...just complete the form on the right. 
Download Parker's New Whitepaper: 
"Understanding Critical Specifications for Dynamic Metrology Applications"
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